аЯрЁБс>ўџ 02ўџџџ/џџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџџьЅС)` №RПLbjbj›U›U8љ?љ?L џџџџџџЄ†††††††РдММММ Ш ”` 6ррррррррп с с с с с с $– hў< † рр   ††рр w w w  Ž†р†рп g  п w w ††w рд Р*GПЎкЮМ "w Ы 0 0` w :/ zw w :V$†‹ @рєдЎU ‚Œ qррр  K ррр`     ”””Є8„”””8šЎМ††††††џџџџ Biography of Shinji Okazaki Shinji Okazaki received his BS and PhD degrees in electrical engineering from Tokyo Institute of Technology in 1970 and 1994 respectively. Okazaki joined Hitachi Central Research Laboratory in 1970. From 1970 to 1976, he worked on the development of GaAs FETs, Si MOSFETs and Si Bipolar ICs. In the development of GaAs FETs, he investigated to minimize the noise figures of the device by making fine gate patterning. In the development of Si MOSFETs, he also investigated fine gate patterning to obtain high performance. In the development of Si Bipolar ICs, he studied the process technologies and design methodologies of integrated circuits. He also started the development of electron beam direct writing (EBDW) technology during this period. By the use of electron beam direct writing, he tried to develop fine MOS devices. He also applied the electron beam writing technology to the mask writing technology. He stayed at Rensselaer Polytechnic Institute from 1980 to 1981 as a visiting researcher where he worked on fine patterning technology without using any sophisticated exposure tools. He adopted edge defined patterning method similar to the self aligned double patterning technology. From 1981, he continued development of EBDW technology. He also involved in the development of resolution enhancement technologies for optical lithography from 1983. During this period, he also involved in the development of the metrology system using electron beams. He contributed the development of CD-SEM in Hitachi. He moved from Central Research to Semiconductor division in 1993 and to Device Development Center in 1998. July in 1998, he was assigned as a research manager of EUV laboratory at Association of Super-Advanced Electronics Technologies (ASET). Since 2001 to 2006 he was a director of EUV Process Technology Research Department of ASET. After finishing ASET project, he returned to Hitachi Central Research and worked on the development of the metrology system using electron beams again. In 2009, he left Hitachi and joined Gigaphoton Inc. and assigned as a general manager and principal researcher of EUVA. In 2011, closing EUVA project and returned to Gigaphoton. Currently he is an advisor to General Manager of EUV Development Division and Laser Development Division. He is a Fellow of IEEE, a Fellow of SPIE and a Fellow of Japan Society of Applied Physics and Member of The Institute of Electronics, Information and Communication Engineers(IEICE). History of teaching courses Graduate School of Tokyo Institute of Technology, VLSI Engineering 6 years Graduate School of Osaka University VLSI Technology 4 years Tokyo University Microfab. Technology 2 years Graduate School of Tokyo University Nano-Micro Engineering 4 years National Institute of Advanced Industrial Science and Technology Nano-Technology 8 years   A } Š Ѓ \ А Б 7 J W f g Ь ЫЬ+YjыKLњѕ№ы№ычы№ыты№ычы№ы№нигЮгЮгЮЦh)XhЯ>Цo( hЯ>Цo( h)Xo( h”!}o( h+-Xo( h—фo(hF; hF;o( h vѕo( hweo( h&Po(Б їЫЬш4sІы,L§§§§§§§§§§§§§ L§61@2P:p+-XА‚. 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